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Reactive sputter magnetron reactor for preparation of thin films and simultaneous in situ structural study by X-ray diffraction
(Amer Inst Physics, 2013-01)
The purpose of the designed reactor is (i) to obtain polycrystalline and/or amorphous thin films by controlled deposition induced by a reactive sputtering magnetron and (ii) to perform a parallel in situ structural study ...
Monte Carlo simulation applied in total reflection X-ray fluorescence: Preliminary results
(2013-05-20)
The X-ray Fluorescence (XRF) analysis is a technique for the qualitative and quantitative determination of chemical constituents in a sample. This method is based on detection of the characteristic radiation intensities ...
Monte Carlo simulation applied in total reflection X-ray fluorescence: Preliminary results
(2013-05-20)
The X-ray Fluorescence (XRF) analysis is a technique for the qualitative and quantitative determination of chemical constituents in a sample. This method is based on detection of the characteristic radiation intensities ...
Characterization of tin oxide based sol-gel coatings on borosilicate glasses by X-ray reflectivity
(Kluwer Academic Publ, 2000-12-01)
The X-ray reflectivity technique was applied in the study of tin oxide films deposited by sol-gel dip-coating on borosilicate glasses. The influence of the withdrawal speed and temperature of thermal treatment on the film ...
Application of dynamic ray tracing in the 3-D inversion of seismic-reflection data
(1993)
Possible applications of dynamic ray tracing to the 3-D Born and Kirchhoff inversion of seismic-reflection data are discussed. It is shown that the most important quantities in the inversion integrals, such as the Beylkin ...
An instrument for combining x-ray multiple diffraction and x-ray topographic imaging for examining crystal microcrystallography and perfection
(Amer Inst PhysicsMelvilleEUA, 2009)
The use of a portable total reflection X-ray fluorescence spectrometer for trace element determination in freshwater microcrustaceans (Daphnia)
(PERGAMON-ELSEVIER SCIENCE LTD, 2004)
Retrieving the configuration of grain boundary structure in polycrystalline materials by extraordinary X-ray reflection analysis
(Universidade Federal de Minas GeraisBrasilENG - DEPARTAMENTO DE ENGENHARIA METALÚRGICAICX - DEPARTAMENTO DE FÍSICAUFMG, 2020)
The interaction between atoms of Au and Cu with clean Si(111) surface: A study combining synchrotron radiation grazing incidence X-ray fluorescence analysis and theoretical calculations
(Pergamon-Elsevier B.V. Ltd, 2009-09-15)
In order to evaluate the interactions between Au/Cu atoms and clean Si(l 11) surface, we used synchrotron radiation grazing incidence X-ray fluorescence analysis and theoretical calculations. Optimized geometries and ...
The interaction between atoms of Au and Cu with clean Si(111) surface: A study combining synchrotron radiation grazing incidence X-ray fluorescence analysis and theoretical calculations
(Pergamon-Elsevier B.V. Ltd, 2009-09-15)
In order to evaluate the interactions between Au/Cu atoms and clean Si(l 11) surface, we used synchrotron radiation grazing incidence X-ray fluorescence analysis and theoretical calculations. Optimized geometries and ...