Thickness-dependent piezoelectric behaviour and dielectric properties of lanthanum modified BiFeO3 thin films

dc.contributorUniversidade Estadual Paulista (UNESP)
dc.creatorBiasotto, Glenda
dc.creatorMoura, Francisco
dc.creatorFoschini, César
dc.creatorSilva, Elson Longo da
dc.creatorVarela, José Arana
dc.creatorSimões, Alexandre Zirpoli
dc.date2015-05-15T13:30:14Z
dc.date2016-10-25T20:48:29Z
dc.date2015-05-15T13:30:14Z
dc.date2016-10-25T20:48:29Z
dc.date2011
dc.date.accessioned2017-04-06T08:16:18Z
dc.date.available2017-04-06T08:16:18Z
dc.identifierProcessing and Application of Ceramics, v. 5, n. 1, p. 31-39, 2011.
dc.identifier1820-6131
dc.identifierhttp://hdl.handle.net/11449/123457
dc.identifierhttp://acervodigital.unesp.br/handle/11449/123457
dc.identifierhttp://dx.doi.org/10.2298/PAC1101031B
dc.identifierISSN1820-6131-2011-05-01-31-39.pdf
dc.identifier9848311210578810
dc.identifier8161025003780724
dc.identifier9330470036613511
dc.identifier1922357184842767
dc.identifier1807399214239200
dc.identifier3573363486614904
dc.identifierhttp://www.tf.uns.ac.rs/publikacije/PAC/tablesofcontents.html
dc.identifier.urihttp://repositorioslatinoamericanos.uchile.cl/handle/2250/934070
dc.descriptionBi0.85La0.15FeO3 (BLFO) thin films were deposited on Pt(111)/Ti/SiO2 /Si substrates by the soft chemical method. Films with thicknesses ranging from 140 to 280 nm were grown on platinum coated silicon substrates at 500°C for 2 hours. The X-ray diffraction analysis of BLFO films evidenced a hexagonal structure over the entire thickness range investigated. The grain size of the film changes as the number of the layers increases, indicating thickness dependence. It is found that the piezoelectric response is strongly influenced by the film thickness. It is shown that the properties of BiFeO3 thin films, such as lattice parameter, dielectric permittivity, piezoeletric coefficient etc., are functions of misfit strains.
dc.descriptionFundação de Amparo à Pesquisa do Estado de São Paulo (FAPESP)
dc.descriptionConselho Nacional de Desenvolvimento Científico e Tecnológico (CNPq)
dc.descriptionCoordenação de Aperfeiçoamento de Pessoal de Nível Superior (CAPES)
dc.languageeng
dc.relationProcessing and Application of Ceramics
dc.rightsinfo:eu-repo/semantics/openAccess
dc.subjectThin films
dc.subjectOxides
dc.subjectChemical synthesis
dc.subjectPiezoelectricity
dc.titleThickness-dependent piezoelectric behaviour and dielectric properties of lanthanum modified BiFeO3 thin films
dc.typeOtro


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