dc.contributorUniversidade Estadual Paulista (UNESP)
dc.creatorSouza, Aparecida D. P.
dc.creatorMigon, Helio S.
dc.date2014-05-20T15:31:48Z
dc.date2016-10-25T18:07:46Z
dc.date2014-05-20T15:31:48Z
dc.date2016-10-25T18:07:46Z
dc.date2010-01-01
dc.date.accessioned2017-04-06T00:24:06Z
dc.date.available2017-04-06T00:24:06Z
dc.identifierJournal of Applied Statistics. Abingdon: Routledge Journals, Taylor & Francis Ltd, v. 37, n. 8, p. 1355-1368, 2010.
dc.identifier0266-4763
dc.identifierhttp://hdl.handle.net/11449/40841
dc.identifierhttp://acervodigital.unesp.br/handle/11449/40841
dc.identifier10.1080/02664760903031153
dc.identifierWOS:000280810900008
dc.identifierhttp://dx.doi.org/10.1080/02664760903031153
dc.identifier.urihttp://repositorioslatinoamericanos.uchile.cl/handle/2250/883581
dc.descriptionWe propose alternative approaches to analyze residuals in binary regression models based on random effect components. Our preferred model does not depend upon any tuning parameter, being completely automatic. Although the focus is mainly on accommodation of outliers, the proposed methodology is also able to detect them. Our approach consists of evaluating the posterior distribution of random effects included in the linear predictor. The evaluation of the posterior distributions of interest involves cumbersome integration, which is easily dealt with through stochastic simulation methods. We also discuss different specifications of prior distributions for the random effects. The potential of these strategies is compared in a real data set. The main finding is that the inclusion of extra variability accommodates the outliers, improving the adjustment of the model substantially, besides correctly indicating the possible outliers.
dc.languageeng
dc.publisherRoutledge Journals, Taylor & Francis Ltd
dc.relationJournal of Applied Statistics
dc.rightsinfo:eu-repo/semantics/closedAccess
dc.subjectbinary regression models
dc.subjectBayesian residual
dc.subjectrandom effect
dc.subjectmixture of normals
dc.subjectMarkov chain Monte Carlo
dc.titleBayesian outlier analysis in binary regression
dc.typeOtro


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