High temperature X-ray diffraction study of the U4O9 formation on UO2 sintered plates

dc.contributorComissão National de Energia Nuclear
dc.contributorUniversidade Estadual Paulista (Unesp)
dc.date.accessioned2014-05-27T11:17:24Z
dc.date.available2014-05-27T11:17:24Z
dc.date.created2014-05-27T11:17:24Z
dc.date.issued1991-01-01
dc.identifierJournal of Nuclear Materials, v. 178, n. 1, p. 33-39, 1991.
dc.identifier0022-3115
dc.identifierhttp://hdl.handle.net/11449/64101
dc.identifier10.1016/0022-3115(91)90453-E
dc.identifier2-s2.0-0025792637
dc.identifier9256541983393135
dc.description.abstractThe surface oxidation of UO2 sintered plates at 170-275 ° C was studied in situ by high temperature X-ray diffractometry. At very low oxygen concentration, UO2 is oxidized to U4O9, while at 300°C and argon-20 vol% oxygen it is oxidized up to U3O7. X-ray diffraction profiles of the UO2, U4O9 and U3O7 phases were well characterized during the transformations. The activation energy for the transformation of UO2 to U4O9, obtained from X-ray diffraction data, was found to be 117 ± 9 kJ/mol and 90 ± 14 kJ/mol for the β-(311) and α-(200) reflections, respectively. © 1991.
dc.languageeng
dc.relationJournal of Nuclear Materials
dc.relation2.447
dc.relation1,104
dc.rightsAcesso restrito
dc.sourceScopus
dc.subjectChemical Reactions--Radiation Effects
dc.subjectX-rays--Diffraction
dc.subjectActivation Energy
dc.subjectSintered Plates
dc.subjectUranium Dioxide
dc.titleHigh temperature X-ray diffraction study of the U4O9 formation on UO2 sintered plates
dc.typeArtículos de revistas


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