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Reliability-Aware Design Space Exploration for Fully Integrated RF CMOS PA
(Institute of Electrical and Electronics Engineers, 2020-03)
A design for reliability approach is proposed for fully integrated RF CMOS class A-to-C power amplifiers. Reliability hazards like time dependent dielectric breakdown and hot carrier injection are mapped into the design ...
Formal Reduction Of The Design System In Internal Spaces
(Universidad del Zulia, 2019)