Detector efficiency calibration for extended gamma-ray sources

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Registration in:

http://repositorio.ipen.br/handle/123456789/17881

https://repositorioslatinoamericanos.uchile.cl/handle/2250/8991940

Author

SANTOS, ROBERTO M. dos

GENEZINI, FREDERICO A.

ZAHN, GUILHERME S.

BRAZILIAN WORKSHOP ON NUCLEAR PHYSICS, 33rd

Institutions

Instituto de Pesquisas Energéticas e Nucleares (Brasil)

Subjects

calibration standards

gamma detection

ge semiconductor detectors

monte carlo method

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