Separation of effects due to superimposition using the Rietveld methods in spectra obtained by WDXRF

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Registro en:

http://repositorio.ipen.br/handle/123456789/18340

https://repositorioslatinoamericanos.uchile.cl/handle/2250/8990259

Autor

SALVADOR, V.L.R.

LIMA, N.B.

INTERNATIONAL LATIN-AMERICAN CONFERENCE ON POWDER TECHNOLOGY, 5th

Institución

Instituto de Pesquisas Energéticas e Nucleares (Brasil)

Materias

x-ray fluorescence analysis

mathematical models

structural chemical analysis

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