Evaluation of microscopic parameters for ETU process in diode-pumped Nd:YLF

dc.creatorCOURROL, L.C.
dc.creatorGOMES, L.
dc.creatorRANIERI, I.M.
dc.date1999
dc.date2014-07-30T17:23:03Z
dc.date2014-07-30T18:57:47Z
dc.date2014-07-30T17:23:03Z
dc.date2014-07-30T18:57:47Z
dc.date.accessioned2023-09-28T12:36:45Z
dc.date.available2023-09-28T12:36:45Z
dc.identifier1042-0150
dc.identifierhttp://repositorio.ipen.br/handle/123456789/6280
dc.identifier149
dc.identifier.urihttps://repositorioslatinoamericanos.uchile.cl/handle/2250/8976286
dc.format369-374
dc.relationRadiation Effects and Defects in Solids
dc.rightsopenAccess
dc.sourceApresentado em: 8th Europhysical Conference on Defects in Insulating Materials, July 6-11, 1998, Keele, Staffs, UK
dc.subjectlasers
dc.subjectneodymium lasers
dc.subjectlithium fluorides
dc.subjectyttrium fluorides
dc.subjectdiode-pumped solid state lasers
dc.subjectlaser spectroscopy
dc.subjectexcitation
dc.titleEvaluation of microscopic parameters for ETU process in diode-pumped Nd:YLF
dc.typeArtigo de peri??dico
dc.coverageI


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