Al-based anodic oxide films structure observation using field emission gun scanning electron microscopy

dc.contributorUniversidade Estadual Paulista (UNESP)
dc.creatorRegone, N. N.
dc.creatorFreire, CMA
dc.creatorBallester, M.
dc.date2014-05-20T13:12:01Z
dc.date2016-10-25T16:32:19Z
dc.date2014-05-20T13:12:01Z
dc.date2016-10-25T16:32:19Z
dc.date2006-02-20
dc.date.accessioned2017-04-05T19:15:17Z
dc.date.available2017-04-05T19:15:17Z
dc.identifierJournal of Materials Processing Technology. Lausanne: Elsevier B.V. Sa, v. 172, n. 1, p. 146-151, 2006.
dc.identifier0924-0136
dc.identifierhttp://hdl.handle.net/11449/31
dc.identifierhttp://acervodigital.unesp.br/handle/11449/31
dc.identifier10.1016/j.jmatprotec.2005.09.005
dc.identifierWOS:000235379700019
dc.identifierhttp://dx.doi.org/10.1016/j.jmatprotec.2005.09.005
dc.identifier.urihttp://repositorioslatinoamericanos.uchile.cl/handle/2250/850456
dc.descriptionIn the present work, the anodic oxide films of Al, Al-Cu 4.5% and Al-Si 6.5% alloys are formed using direct and pulse current. In the case of Al-Cu and Al-Si alloys, the electrolyte used contains sulfuric acid and oxalic acid, meanwhile for Al the electrolyte contains sulfuric acid only. Al-Cu alloy was submitted to a heat treatment in order to decrease the effect of inter metallic phase theta upon the anodic film structure. Fractured samples were observed using a field emission gun scanning electron microscope JSM-6330F at (LME)/Brazilian Synchrotron Light Laboratory (LNLS), Campinas, SP, Brazil. The oxide film images enable evaluation of the pore size and form with a resolution similar to the transmission electron microscope (TEM) resolution. It is also observed that the anodizing process using pulse current produces an irregular structure of pore walls, and by direct cur-rent it is produced a rectilinear pore wall. (c) 2005 Elsevier B.V. All rights reserved.
dc.languageeng
dc.publisherElsevier B.V.
dc.relationJournal of Materials Processing Technology
dc.rightsinfo:eu-repo/semantics/closedAccess
dc.subjectanodizing
dc.subjectfield emission gun microscopy
dc.subjectaluminum
dc.subjectAl-Cu alloy
dc.subjectAl-Si alloy
dc.titleAl-based anodic oxide films structure observation using field emission gun scanning electron microscopy
dc.typeOtro


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