The wheat curl mite, Aceria toschiella (Keifer), and a complex of viruses vectored by A. toschiella substantially reduce wheat yields in every wheat-producing continent in the world. The development of A. toschiella-resistant wheat cultivars is a proven economically and ecologically viable method of controlling this pest. This study assessed A. toschiella resistance in wheat genotypes containing the H13, H21, H25, H26, H18 and Hdic genes for resistance to the Hessian fly, Mayetiola destructor (Say) and in 94M370 wheat, which contains the Dn7 gene for resistance to the Russian wheat aphid, Diuraphis noxia (Kurdjumov). A. toschiella populations produced on plants containing Dn7 and H21 were significantly lower than those on plants of the susceptible control and no different than those on the resistant control. Dn7 resistance to D. noxia and H21 resistance to M. destructor resulted from translocations of chromatin from rye into wheat (H21—2BS/2RL, Dn7—1BL/1RS). These results provide new wheat pest management information, indicating that Dn7 and H21 constitute resources that can be used to reduce yield losses caused by A. toschiella, M. destructor, D. noxia, and wheat streak mosaic virus infection by transferring multi-pest resistance to single sources of germplasm.