Article
Electrical properties and spectroscopic ellipsometry studies of covellite CuS thin films deposited from non ammoniacal chemical bath
Registro en:
2-s2.0-85063346438
Autor
Diliegros-Godines C.J., Lombardero-Juarez D.I., Machorro-Mejía R., González R.S., Pal M.
Institución
Resumen
https://www.scopus.com/inward/record.uri?eid=2-s2.0-85063346438&doi=10.1016%2fj.optmat.2019.03.022&partnerID=40&md5=e683bdd2db6d22b6b4141c8eddab27b1