dc.creatorFRANCISCO PARAGUAY DELGADO
dc.creatorMARIO MIKI YOSHIDA
dc.date1999
dc.date.accessioned2023-07-21T15:31:46Z
dc.date.available2023-07-21T15:31:46Z
dc.identifierhttp://cimav.repositorioinstitucional.mx/jspui/handle/1004/2227
dc.identifier.urihttps://repositorioslatinoamericanos.uchile.cl/handle/2250/7728132
dc.descriptionZinc oxide thin films were prepared by spray pyrolytic decomposition of zinc acetate onto a glass substrate. Auger spectroscopy showed that the film stoichiometry is close to the ZnO phase with a little excess of oxygen. X-ray diffraction spectra show that the structure belongs to the hexagonal wurtzite crystal type, with a mean crystallite size in the range 20-33 nm. Under optimized deposition conditions films are caxis oriented, having a full width at half-maximum (FWHM) value of the (002) X-ray diffraction line of 0.238. Microstructure was analysed by scanning electron microscopy (SEM), transmission electron microscopy (TEM), and high resolution electron microscopy (HREM). In regard to the crystal growth, a critical temperature was found to be around 600 K. Above this critical temperature the film is c-axis oriented and almost all grains became round shaped. Optical constants, n and k, were determined using only transmittance data and a direct band gap of 3.28 eV was deduced.
dc.formatapplication/pdf
dc.languageeng
dc.rightsinfo:eu-repo/semantics/openAccess
dc.rightshttp://creativecommons.org/about/cc0/
dc.subjectinfo:eu-repo/classification/Spray pyrolysis/Zinc oxide
dc.subjectinfo:eu-repo/classification/Scanning electron microscopy/Transmission electon microscopy
dc.subjectinfo:eu-repo/classification/cti/2
dc.subjectinfo:eu-repo/classification/cti/23
dc.subjectinfo:eu-repo/classification/cti/2399
dc.subjectinfo:eu-repo/classification/cti/239999
dc.subjectinfo:eu-repo/classification/cti/239999
dc.titleGrowth, structure and optical characterization of high quality ZnO thin films obtained by spray pyrolysis
dc.typeinfo:eu-repo/semantics/article


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