"This thesis work presents the development of a phase recovery technique for surface strain and deformation measurement. This technique is based on electronic speckle shearing pattern interferometry (ESSPI), also known as shearography. Shearography is a non invasive optical technique that can be applied to displacement, strain or vibration analysis. Due to its common path design, shearography is less sensitive to environmental disturbances than electronic speckle pattern interferometry (ESPI) or holographic interferometry (HI), facilitating its application in industrial environments. Moreover, digital shearography permits the adjustment of the measurement sensitivity without changing the optical setup. Part of this work is to promote shearography as an essential tool for qualitative and quantitative strain and deformation analysis. This application involves an examination of different aspects that will be presented in four main parts: First, a theoretical analysis on shearography; then, an analysis to extract directional strain components; next, the development of the image processing methods associated in the phase extraction. In the last part, the proposed technique is applied in two different experiments in order to validate its performance."