info:eu-repo/semantics/article
Fast jitter tolerance testing for high-speed serial links in post-silicon validation
Fecha
2021-11Registro en:
A. Viveros-Wacher, R. Baca-Baylón, F. E. Rangel-Patiño, J. L. Silva-Cortés, E. A. Vega-Ochoa, and J. E. Rayas-Sánchez, “Fast jitter tolerance testing for high-speed serial links in post-silicon validation,” IEEE Trans. Electromagnetic Compatibility., early access version, 2022.
0018-9375
Autor
Viveros-Wacher, Andrés
Baca-Baylón, Ricardo
Silva-Cortés, Johana L.
Vega-Ochoa, Edgar A.
Rayas-Sánchez, José E.
Rangel-Patiño, Francisco E.