Construção de um sistema de caracterização das propriedades de transporte de filmes finos pelo efeito Hall

Abstract

In this work was built a system to determine transport properties such as electrical resistivity, charge carrier density and mobility of thin films using Hall effect in special conditions of undergraduate laboratory using no special materials either instruments. SnO2 thin films doped with fluor obtained by chemical process were characterized using the developed methodology and presented consistent results those reported in literature. © Sociedade Brasileira de Física. Printed in Brazil.