Actas de congresos
DC method for self-heating estimation applied to FinFET
Fecha
2018-01-01Registro en:
2018 33rd Symposium On Microelectronics Technology And Devices (sbmicro). New York: Ieee, 4 p., 2018.
WOS:000451195800042
0496909595465696
0000-0002-0886-7798
Autor
Universidade de São Paulo (USP)
Universidade Estadual Paulista (Unesp)
Institución
Resumen
This paper reports an extension on the application of the DC method for the estimation of self-heating effects from planar to FinFET devices, verified through theoretical considerations and numerical simulations. In the worst case, a difference of 5.6% was observed on the estimation of the transistors channel temperature when compared to a traditional method.