conferenceObject
Digital control system using a thermoelectric cell for temperature electronic devices testing
Date
2010Registration in:
BAZZO, João Paulo ; SILVA, J. C. C. ; CARATI, Emerson Giovani ; VOGT, Márcio de Andrade ; LUKASIEVICZ, Tiago . Digital Control System Using a Thermoelectric Cell for Temperature Electronic Devices Testing. In: IEEE Latin American Symposium on Circuits and Systems, 2010, Foz do Iguaçu. Proceedings of LASCAS 2010. Porto Alegre : UFRGS, 2010. v. único. p. 4-7.
Author
Bazzo, João Paulo
Silva, Jean Carlos Cardoso da
Carati, Emerson G.
Vogt, Marcio de Andrade
Lukasievicz, Tiago
Institutions
Abstract
This paper presents a temperature digital
control system for performance evaluation of electronic devices under different operating temperatures. The system is based on a thermoelectric module of Peltier effect, which is used for heating or cooling the device under test (DUT). A digital PI controller is designed through simulations with an electric model of the structure, developed in Simulink®. Based on the parameters and results from simulations, the controller is implemented in Labview® and experimental results are obtained using a servo amplifier like actuator.
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