dc.contributorIng. Leonardo Rivas Arce
dc.creatorCastro-González, Alberto
dc.date.accessioned2019-03-19T16:41:47Z
dc.date.accessioned2022-10-19T22:54:24Z
dc.date.available2019-03-19T16:41:47Z
dc.date.available2022-10-19T22:54:24Z
dc.date.created2019-03-19T16:41:47Z
dc.date.issued2018
dc.identifierhttps://hdl.handle.net/2238/10442
dc.identifier.urihttps://repositorioslatinoamericanos.uchile.cl/handle/2250/4513015
dc.description.abstractThe 10x1000 s lifetest are quality control processes performed on the GDT components. The system in charge of recreate this tests in the company is very old and show important deficiencies in the process. Among them, the most important lack in the system is the low level of automation, especially in the preparation of the test, because this system require a great contribution of the operator to generate the lifetest. This proyect shows the process of designing an algorith for automatic batch type system, capable of increase the automation level for the test. The LabView tool was used to achieve a complete system with a more intuitive graphical interphace. Throughout this work the results obtained for the design algorith will be shown and will be supported with the ITU-T k.12 standard.
dc.languagespa
dc.publisherInstituto Tecnológico de Costa Rica
dc.subjectPruebas
dc.subjectVida
dc.subjectVoltaje
dc.subjectvoltaje DCBD
dc.subjectResistencia
dc.subjectAislamiento
dc.subjectAutomatización
dc.subjectImpulsos
dc.subjectCorriente
dc.subjectResearch Subject Categories::TECHNOLOGY::Electrical engineering, electronics and photonics::Electronics
dc.titleDiseño del sistema de control tipo batch para las pruebas de vida útil de 10A 10/1000 s de los componentes GDT
dc.typelicentiateThesis


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