Absorptance homogeneity and its relaxation in thin films by photothermal microscopy

Zaldivar Escola, Facundo; Mingolo, Nelida; Martinez, Oscar Eduardo; Rocca, Jorge J.; Menoni, Carmen S.

info:eu-repo/semantics/publishedVersion

Fecha

2019

Registro en:

Absorptance homogeneity and its relaxation in thin films by photothermal microscopy; Optical Interference Coatings Conference; Santa Ana Pueblo; Estados Unidos; 2019; 1-3

978-1-943580-58-3

http://hdl.handle.net/11336/161856

CONICET Digital

CONICET

https://repositorioslatinoamericanos.uchile.cl/handle/2250/4342250

Autor

Zaldivar Escola, Facundo

Mingolo, Nelida

Martinez, Oscar Eduardo

Rocca, Jorge J.

Menoni, Carmen S.

Institución

Consejo Nacional de Investigaciones Científicas y Tecnológicas (Argentina)

Resumen

A photothermal microscope for absorptance homogeneity analysis is described. Absorptance maps with micrometer resolution and high sensitivity are obtained. Changes in absorptance are due to laser annealing of defects via one and two-photon processes.

Materias

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