Artigo
Structural depth profile and nanoscale piezoelectric properties of randomly oriented Pb(Zr0.50Ti0.50)O-3 thin films
Fecha
2012-05-30Registro en:
Journal of Physics D-applied Physics. Bristol: Iop Publishing Ltd, v. 45, n. 21, p. 6, 2012.
0022-3727
10.1088/0022-3727/45/21/215304
WOS:000304056100011
6725982228402054
Autor
Universidade Estadual Paulista (Unesp)
Universidade Federal do Ceará (UFC)
Univ Aveiro
Resumen
The structural properties of Pb(Zr0.50Ti0.50)O-3 thin films with no preferential orientation were studied throughout the film thickness. An analysis on depth profile shows the existence of a significant (1 0 0) alignment near the film-electrode interface. Nanoscale piezoelectric measurements demonstrate the existence of a self-polarization effect in the studied films. An increase in this effect with film thickness increasing from 200 to 710 nm suggests that Schottky barriers and/or mechanical coupling near the film-electrode interface cannot be the main mechanisms responsible for the self-polarization effect in the studied films.