Observation of moiré superlattices on twisted bilayer graphene by scanning microwave impedance microscopy

Artigo de Evento

Fecha

2020

Registro en:

https://doi.org/10.1117/12.2570651

http://hdl.handle.net/1843/44021

https://orcid.org/0000-0003-1634-0264

https://orcid.org/0000-0002-0388-8688

https://orcid.org/0000-0002-5978-2735

https://orcid.org/0000-0001-5309-2488

https://orcid.org/0000-0002-6350-7680

https://orcid.org/0000-0002-1239-3222

https://orcid.org/0000-0002-4658-3243

https://orcid.org/0000-0001-6792-7554

https://orcid.org/0000-0002-8883-4223

http://repositorioslatinoamericanos.uchile.cl/handle/2250/3837207

Autor

Douglas August Alexander Ohlberg

Cássio Gonçalves do Rego

Ado Jorio de Vasconcelos

Gilberto Medeiros Ribeiro

Andreij de Carvalho Gadelha

Diego Camilo Tami López

Eliel Gomes da Silva Neto

Daniel A. Miranda

Jéssica Santos Lemos

Fabiano Costa Santana

Leonardo Cristiano Campos

Jhonattan Córdoba Ramírez

Institución

Universidade Federal de Minas Gerais (Brasil)

Materias

Microwave impedance microscopy

Bilayer graphene

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