Physical properties of strontium barium niobate thin films prepared by polymeric chemical method

Abstract

Randomly oriented Sr0.75Ba0.25Nb2O6 thin films have been deposited on Pt(111)/Ti/SiO2/Si substrates using a polymeric chemical method to study their physical properties. Refinements of the structure confirm the stoichiometry of the studied films. The relaxor behavior is evidenced by the dielectric measurements and Vogel-Fulcher analysis of the dielectric curves. Lowering the transition temperature (T-m) by about 100K and asymmetries in the local hysteresis loops well above T-m are discussed in terms of the existence of complex defects in thin films.