Artículos de revistas
Surface roughness and surface-induced resistivity of gold films on mica: Application of quantitative scanning tunneling microscopy
Fecha
2000Registro en:
Physical Review B - Condensed Matter and Materials Physics, Volumen 62, Issue 7, 2018, Pages 4686-4697
1550235X
10980121
10.1103/PhysRevB.62.4686
Autor
Munoz, Raúl C.
Vidal, Guillermo
Mulsow, Marcelo
Lisoni, Judit G.
Arenas, Claudio
Concha, Andres
Mora, Fernando
Espejo, Roberto
Kremer, Germán
Moraga, Luis
Institución
Resumen
We report measurements of the resistivity (Formula presented) of a gold film 70 nm thick deposited on mica preheated to 300 °C in UHV, performed between 4 and 300 K, and measurements of the surface topography of the same film performed with a scanning tunneling microscope (STM). From the roughness measured with the STM we determine the parameters δ (rms amplitude) and ξ (lateral correlation length) corresponding to a Gaussian representation of the average height-height autocorrelation function (ACF). We use the parameters δ and ξ to calculate the quantum reflectivity R and the increase in resistivity induced by electron-surface scattering on this film, according to a modified version of the theory of Sheng, Xing, and Wang (mSXW) [Munoz et al., J. Phys.: Condens. Matter 11, L299 (1999)]. The mSXW theory is able to select the appropriate scale of distance over which corrugations take place, leading to (Formula presented) for corrugations taking place over scales of distances that are lon