Standardless semi-quantitative analysis by PIXE

Rodriguez Cabello, Tabatha Pamela; Limandri, Silvina Paola; Suarez, Sergio Gabriel; Ortega Feliu, Inés; Trincavelli, Jorge Carlos

Artículos de revistas

Fecha

2017-05

Registro en:

Rodriguez Cabello, Tabatha Pamela; Limandri, Silvina Paola; Suarez, Sergio Gabriel; Ortega Feliu, Inés; Trincavelli, Jorge Carlos; Standardless semi-quantitative analysis by PIXE; Royal Society of Chemistry; Journal of Analytical Atomic Spectrometry; 32; 5; 5-2017; 1020-1030

0267-9477

http://hdl.handle.net/11336/61252

1364-5544

CONICET Digital

CONICET

http://repositorioslatinoamericanos.uchile.cl/handle/2250/1873075

Autor

Rodriguez Cabello, Tabatha Pamela

Limandri, Silvina Paola

Suarez, Sergio Gabriel

Ortega Feliu, Inés

Trincavelli, Jorge Carlos

Institución

Consejo Nacional de Investigaciones Científicas y Tecnológicas (Argentina)

Resumen

A method based on the refinement of atomic and experimental parameters developed for the description of PIXE spectra is presented and applied to standardless semi-quantitative PIXE analysis. This method was implemented in the sofware PAMPA (Parameter Assessment Method for PIXE Analysis) and consists in minimizing the quadratic differences between an experimental spectrum and an analytical function proposed to describe it. The first results of PAMPA are presented for the quantification of synthetic and mineral, thin and bulk samples, and they are compared with the results obtained with a commercial software.

Materias

PIXE ANALYSIS

STANDARDLESS ANALYSIS

X-RAY EMISSION

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