Evaluation of the piezoelectric behaviour produced by a thick-film transducer using digital speckle pattern interferometry

dc.creatorTendela, Lucas Pedro
dc.creatorFederico, Roque Alejandro
dc.creatorKaufmann, Guillermo Hector
dc.date.accessioned2017-04-11T19:56:38Z
dc.date.accessioned2018-11-06T12:29:13Z
dc.date.available2017-04-11T19:56:38Z
dc.date.available2018-11-06T12:29:13Z
dc.date.created2017-04-11T19:56:38Z
dc.date.issued2011-02
dc.identifierTendela, Lucas Pedro; Federico, Roque Alejandro; Kaufmann, Guillermo Hector; Evaluation of the piezoelectric behaviour produced by a thick-film transducer using digital speckle pattern interferometry; Elsevier; Optics And Lasers In Engineering; 49; 2; 2-2011; 281-284
dc.identifier0143-8166
dc.identifierhttp://hdl.handle.net/11336/15163
dc.identifier.urihttp://repositorioslatinoamericanos.uchile.cl/handle/2250/1867185
dc.description.abstractThis paper presents an interferometric measurement of the out-of-plane deflections produced by a piezoelectric transducer, manufactured by thick-film deposition of a ceramic paste over an alumina substrate, when is subjected to a DC electric voltage. It is shown that a digital speckle pattern interferometer with an incorporated phase-shifting facility allows the measurement of nanometer displacements generated by the piezoelectric device. These measurements are used to evaluate the effective piezoelectric charge constant along the polarization direction (d33)eff that characterizes the thick-film transducer.
dc.languageeng
dc.publisherElsevier
dc.relationinfo:eu-repo/semantics/altIdentifier/doi/http://dx.doi.org/10.1016/j.optlaseng.2010.10.002
dc.relationinfo:eu-repo/semantics/altIdentifier/url/http://www.sciencedirect.com/science/article/pii/S0143816610002125
dc.rightshttps://creativecommons.org/licenses/by-nc-nd/2.5/ar/
dc.rightsinfo:eu-repo/semantics/restrictedAccess
dc.subjectDigital speckle pattern interferometry
dc.subjectPiezoelectric transducers
dc.subjectThick films
dc.subjectScreen printed ceramics
dc.titleEvaluation of the piezoelectric behaviour produced by a thick-film transducer using digital speckle pattern interferometry
dc.typeArtículos de revistas
dc.typeArtículos de revistas
dc.typeArtículos de revistas


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