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Chile
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ANID (Chile)
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Chile
Gobierno
ANID (Chile)
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Proyecto
THE EFFECT OF ELECTRON-SURFACE SCATTERING AND ELECTRON-GRAIN BOUNDARY SCATTERING ON CHARGE TRANSPORT IN THIN METALLIC FILMS.
Date
2008
Registration in:
http://hdl.handle.net/10533/121061
1085026
M
5432336
0
http://repositorioslatinoamericanos.uchile.cl/handle/2250/1518953
Author
Universidad de Chile
Universidad de Chile
Institutions
ANID (Chile)
Subjects
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