Artículos de revistas
Ultrafast X-Ray Scattering of Xenon Nanoparticles: Imaging Transient States of Matter
Registro en:
Physical Review Letters. Amer Physical Soc, v. 108, n. 9, 2012.
0031-9007
WOS:000300943200004
10.1103/PhysRevLett.108.093401
Autor
Bostedt, C
Eremina, E
Rupp, D
Adolph, M
Thomas, H
Hoener, M
de Castro, ARB
Tiggesbaumker, J
Meiwes-Broer, KH
Laarmann, T
Wabnitz, H
Plonjes, E
Treusch, R
Schneider, JR
Moller, T
Institución
Resumen
Femtosecond x-ray laser flashes with power densities of up to 10(14) W/cm(2) at 13.7 nm wavelength were scattered by single xenon clusters in the gas phase. Similar to light scattering from atmospheric microparticles, the x-ray diffraction patterns carry information about the optical constants of the objects. However, the high flux of the x-ray laser induces severe transient changes of the electronic configuration, resulting in a tenfold increase of absorption in the developing nanoplasma. The modification in opaqueness can be correlated to strong atomic charging of the particle leading to excitation of Xe4+. It is shown that single-shot single-particle scattering on femtosecond time scales yields insight into ultrafast processes in highly excited systems where conventional spectroscopy techniques are inherently blind. 108 9 BMBF [05KS4KT1, 05KS7KT2] HGF Virtuelles Institut [VH-VI-103, VH-VI-302] BMBF [05KS4KT1, 05KS7KT2] HGF Virtuelles Institut [VH-VI-103, VH-VI-302]