Artículos de revistas
EFFECT OF FREE-CARRIER SCREENING ON THE ULTRAFAST RELAXATION KINETICS IN HOT POLAR SEMICONDUCTORS
Registro en:
Physical Review B. American Physical Soc, v. 32, n. 4, n. 2388, n. 2392, 1985.
0163-1829
WOS:A1985APH0800065
10.1103/PhysRevB.32.2388
Autor
ALGARTE, ACS
Institución
Resumen
32 4 2388 2392