Artículos de revistas
Measurement of refractive index of GaSb (1.8 to 2.56 mu m) using a prism
Registro en:
Electronics Letters. Iee-inst Elec Eng, v. 32, n. 3, n. 262, n. 264, 1996.
0013-5194
WOS:A1996UL76800084
Autor
Uribe, MM
deOliveira, CEM
Clerice, JH
Miranda, RS
Zakia, MB
deCarvalho, MMG
Patel, NB
Institución
Resumen
The authors have measured the refractive index of GaSb for the transparent region from 1.8 to 2.56 mu m using refraction in a prism. The values obtained agree well. with those recently measured by the authors using ellipsometry. A good fit to the experimental data is obtained using the single oscillator model. 32 3 262 264