Artículos de revistas
CHARACTERIZATION OF PHOTODEPOSITED SELENIUM PLANAR STRUCTURES BY SCANNING FORCE MICROSCOPY
Registro en:
Journal Of Applied Physics. Amer Inst Physics, v. 77, n. 12, n. 6208, n. 6213, 1995.
0021-8979
WOS:A1995RD57200017
10.1063/1.359149
Autor
PELED, A
BARANAUSKAS, V
RODRIGUES, C
ARTWEISMAN, D
GRANTMAN, L
FRIESEM, AA
Institución
Resumen
77 12 6208 6213