Actas de congresos
Characterization Of Ultra-thin Films Of Pd Deposited On Au(111)
Registro en:
Topics In Catalysis. , v. 54, n. 01/04/15, p. 70 - 76, 2011.
10225528
10.1007/s11244-011-9649-2
2-s2.0-79951942115
Autor
Pancotti A.
Nascente P.A.P.
De Siervo A.
Landers R.
Carazzolle M.F.
Tallarico D.A.
Kleiman G.G.
Institución
Resumen
Ultra-thin films (1 and 3 monolayers) of Pd were deposited on the Au(111) surface and then characterized by X-ray photoelectron spectroscopy (XPS), X-ray excited Auger spectroscopy (XAES), low-energy electron diffraction (LEED), and X-ray photoelectron diffraction (XPD). For the 1 ML Pd film annealed at 450 °C, XPS and XAES results indicated that Pd had diffused into the Au substrate. 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