Errata
Erratum: Thermoelastic Analysis Of A Silicon Surface Under X-ray Free-electron-laser Irradiation (review Of Scientific Instruments (2010) 81 (073102))
Registro en:
Review Of Scientific Instruments. , v. 82, n. 4, p. - , 2011.
346748
10.1063/1.3575590
2-s2.0-79955638829
Autor
De Castro A.R.B.
Vasconcellos A.R.
Luzzi R.
Institución
Resumen
[No abstract available] 82 4