Actas de congresos
Speckle Pattern Direct Photographic Correlation For Measuring Surface Roughness
Registro en:
Proceedings Of Spie - The International Society For Optical Engineering. Spie, v. 813, n. , p. 561 - 562, 1987.
0277786X
10.1117/12.967396
2-s2.0-0005024207
Autor
Sthel M.S.
Lunazzi J.J.
Hogert E.N.
Gaggioli N.G.
Institución
Resumen
Coordenação de Aperfeiçoamento de Pessoal de Nível Superior (CAPES) The absolute measurement of the intensity correlation of a speckle pattern was previously demonstrated by using a photographic real-time technique (1). In this paper we demonstrate its use for the measurement of surface roughness in the 1-30,μm range, achieving many practical advantages over the two versions of a previous similar technique (2)(3). 813
561 562 CAPES; Coordenação de Aperfeiçoamento de Pessoal de Nível Superior; FAPERGS; Coordenação de Aperfeiçoamento de Pessoal de Nível Superior Coordenação de Aperfeiçoamento de Pessoal de Nível Superior (CAPES)