Artículos de revistas
Esi-tem Imaging Of Surfactants And Ions Sorbed In Stöber Silica Nanoparticles
Registro en:
Langmuir. , v. 22, n. 17, p. 7159 - 7166, 2006.
7437463
10.1021/la060389p
2-s2.0-33748561808
Autor
Costa C.A.R.
Leite C.A.P.
Galembeck F.
Institución
Resumen
The sorption of surfactants and NaCl in silica nanosized particles creates unexpected spatial distributions of solutes that were evidenced by electron spectroscopy imaging in the transmission electron microscope (ESI/TEM). The spectral images show that simple ions (Na+, Cl-, Br -) are actually absorbed within the particles irrespective of their charges, while surfactant chains are adsorbed at the particle surfaces. The expected effect of the surfactants on particle aggregation is also observed in the micrographs. In the case of salt, close-packed silica particle arrays are formed at low ionic strength, but only coarse aggregates form at higher salt concentrations. The particles absorb both Na+ and Cl- ions in similar amounts, from 0.5 mol L-1 NaCl, but Na+ ions are depleted from the particles' immediate outer vicinity, where Cl- ions are in turn accumulated. These results confirm that Stöber silica nanoparticles are highly porous and reveal their potential usefulness as carriers of small molecules and ions, due to the small particle size, exceptional colloidal stability, and this newly found sorption behavior. © 2006 American Chemical Society. 22 17 7159 7166 Bjelopavlic, M., Singh, P.K., El-Shall, H., Moudgil, B.M., (2000) J. Colloid Interface Sci., 226, pp. 159-165 Pasquato, L., Pengo, P., Scrimin, P., (2005) Supramol. Chem., 17, pp. 163-171 Phadtare, S., Vinod, V.P., Wadgaonkar, P.P., Rao, M., Sastry, M., (2004) Langmuir, 20, pp. 3717-3723 Piech, M., Walz, J.Y., (2004) J. Phys. Chem. B, 108, pp. 9177-9188 Bailey, R.E., Nie, S.M., (2003) J. Am. Chem. Soc., 125, pp. 7100-7106 Manciu, F.S., Tallman, R.E., McCombe, B.D., Weinstein, B.A., Lucey, D.W., Sahoo, Y., Prasad, P.N., (2005) Phys. E, 26, pp. 14-18 Lu, S.W., Sohling, U., Mennig, M., Schmidt, H., (2002) Nanotechnology, 13, pp. 669-673 Caruso, F., Lichtenfelf, H., Giersig, M., Möhwald, H., (1998) J. Am. Chem. Soc., 120, pp. 8523-8524 Galembeck, F., Lima, E.C.O., Massen, N.C., Monteiro, V.A.R., Souza, E.F., (1996) Fine Particles Science and Technology: from Micro- to Nanoparticles, pp. 267-279. , Pelizzetti, E., Ed. Kluwer: Dordrecht, The Netherlands Chen, Y., Ford, W.T., Materer, N.F., Teeters, D., (2000) J. Am. Chem. Soc., 122, pp. 10472-10473 Pan, G.S., Tse, A.S., Kesavamoorthy, R., Asher, S.A., (1998) J. Am. Chem. Soc., 120, pp. 6518-6524 Mori, H., Müller, A.H.E., Klee, J.E., (2003) J. Am. Chem. Soc., 125, pp. 3712-3713 Stöber, W., Fink, A., Bohn, E., (1968) J. Colloid Interface Sci., 26, pp. 62-69 Hardikar, V.V., Matrjevic, E., (2000) J. Colloid Interface Sci., 227, pp. 133-136 Chabanov, A.A., Jun, Y., Norris, D.J., (2004) Appl. Phys. Lett., 84, pp. 3573-3575 Pontoni, D., Narayanan, T., Rennie, A.R., (2002) Langmuir, 18, pp. 56-59 Green, D.L., Lin, J.S., Lam, Y.F., Hu, M.Z.C., Schaefer, D.W., Harris, M.T., (2003) J. Colloid Interface Sci., 255, pp. 346-358 Tolnai, G., Csempesz, F., Kabai-Faix, M., Kalman, E., Keresztes, Z., Kovacs, A.L., Rambsden, J.J., Horvolgyi, Z., (2001) Langmuir, 17, pp. 2683-2687 Liu, J., Pelton, R., Hrymak, A.N., (2000) J. Colloid Interface Sci., 227, pp. 408-411 Kobayashi, Y., Katakami, H., Mine, E., Nagao, D., Konno, M., Liz-Marzan, L.M., (2005) J. Colloid Interface Sci., 283, pp. 392-396 Costa, C.A.R., Leite, C.A.P., Souza, E.F., Galembeck, F., (2001) Langmuir, 17, pp. 189-194 Costa, C.A.R., Leite, C.A.P., Galembeck, F., (2003) J. Phys. Chem. B, 107, pp. 4747-4755 Leite, C.A.P., Souza, E.F., Galembeck, F., (2001) J. Braz. Chem. Soc., 12, pp. 519-525 Iler, R.K., (1979) The Chemistry of Silica, , Wiley. New York Jain, T.K., Roy, I., De, T.K., Maitra, A., (1998) J. Am. Chem. Soc., 120, pp. 11092-11095 Kulak, A., Hall, S.R., Mann, S., (2004) Chem. Commun., 5, pp. 576-577 Bauer, D., Buchhammer, H., Fuchs, A., Jaeger, W., Killmann, E., Lunkwitz, K., Rehmet, R., Schwarz, S., (1999) Colloids Surf., A, 156, pp. 291-305 Oh, M.H., So, J.H., Lee, J.D., Yang, S.M., (1999) Korean J. Chem. Eng., 16, pp. 532-537 Suratwala, T., Hanna, M.L., Whitman, P., (2004) J. Non-cryst. Solids, 349, pp. 368-376 Kim, D.Y., Kowach, G.R., Johnson, D.W., Bhandarkar, S., Du, H., (2004) J. Non-cryst. Solids, 342, pp. 18-24 Ohno, T., Suzuki, H., Takahashi, J., Shimada, S., Ota, T., Takahashi, M., Hikichi, Y., (2002) Key Eng. Mater., 206, pp. 2185-2188 Amalvy, J.I., Percy, M.J., Armes, S.P., Leite, C.A.P., Galembeck, F., (2005) Langmuir, 21, pp. 1175-1179 Phan, T.N.T., Louvard, N., Bachiri, S.A., Perselho, J., Foissy, A., (2004) Colloids Surf., 244, pp. 131-140 Gabriel, U., Charlet, L., Schlapfer, C.W., Vial, J.C., Brachmann, A., Geipel, G., (2001) J. Colloid Interface Sci., 239, pp. 358-368 Dekany, I., Nemeth, J., Szekeres, M., Schoonheydt, R., (2003) Colloid Polym. Sci., 282, pp. 1-6 Wang, Z., Friedrich, D.M., Bersersluis, M.R., Hemmer, S.L., Joly, A.G., Huesemann, M.H., Truex, M.I., Peyton, B.M., (2001) Environ. Sci. Technol., 35, pp. 2710-2716 Bhosale, S., Wang, T.Y., Li, G.T., Siggel, U., Fuhrhop, J.H., (2004) J. Am. Chem. Soc., 126, pp. 13111-13118 Ozkaya, D., Zhou, W., Thomas, I.M., Midgley, P., Keast, V.J., Hermans, S., (1999) Catal. Lett., 60, pp. 113-120 Qalembeck, F., Souza, E.F., (1999) Polymer Interfaces and Emulsions, pp. 119-166. , Esumi, K., Ed. Marcel Dekker: New York Rosemary, M.I., MacLeren, I., Pradeep, T., (2004) Carbon, 42, pp. 2352-2356 Rippel, M.M., Leite, C.A.P., Lee, L.T., Galembeck, F., (2005) Colloid Polym. Sci., 283, pp. 570-574 Sun, X.H., Li, C.P., Wong, W.K., Wong, N.B., Lee, C.S., Lee, S.T., Leo, B.K., (2002) J. Am. Chem. Soc., 124, pp. 14464-14471 Wiacek, A., Chibowski, E., (2000) Colloids Surf., B, 17, pp. 175-190 Soltys, A., Lazarz, M., Chibowski, E., (1997) Colloids Surf., A, 127, pp. 163-173 Castaing, R., Hennenquin, J.F., Henry, L., Slodzian, G., The magnetic prism as an optical system (1967) Focusing of Charged Particles, pp. 265-293. , Septier, A., Ed. Academic Press: New York Egerton, R.F., (1986) Electron Energy-loss Spectroscopy in the Electron Microscope, , Plenum Press New York Reimer, L., Zepke, U., Moesch, J., Schulze-Hillert, S., Ross-Messemer, M., Probst, W., Weimer, E., (1992) EELS Spectroscopy: A Reference Handbook of Standard Data for Identification and Interpretation of Electron Energy-loss Spectra and for Generation of Electron Spectroscopic Images, , Carl Zeiss: Oberkochen, Germany Probst, W., personal communicationJoy, D.C., (1986) Principles of Analytical Electron Microscopy, p. 256. , Plenum Press: New York Principles of Analytical Electron Microscopy, 50, p. 20 Kiraly, Z., Tun, L., Dekany, I., Bean, K., Vincent, B., (1995) Magy. Kem. Foly., 101, pp. 501-510 Denkov, N.D., Velev, O.D., Kralchevsky, P.A., Ivanov, I.B., Yoshimura, H., Nagayama, K., (1992) Langmuir, 8, pp. 3183-3190 Cardoso, A.H., Leite, C.A.P., Galembeck, F., (2001) Colloids Surf., A, 181, pp. 49-55 Szekeres, M., Tóth, J., Dékány, I., (2002) Langmuir, 18, pp. 2678-2685 Goncalves, M.D., Marques, G.D.S., Galembeck, F., (1983) Sep. Sci. Technol., 18, pp. 893-904 Wiese, H., Rupaner, R., (1999) Colloid Polym. Sci., 277, pp. 372-375 Kazakov, S.V., Kaholek, M., (2002) Proc. SPIE Int. Soc. Opt. Eng., 4695, pp. 42-51 Lee, L.-T., Leite, C.A.P., Galembeck, F., (2004) Langmuir, 20, pp. 4430-4435 Galembeck, F., Costa, C.A.R., Galembeck, A., Silva, M.D.C.V.M., (2001) An. Acad. Bras. Ciênc., 73, pp. 495-510