Buscar
Mostrando ítems 21-30 de 1124
Microstructure, dielectric properties and optical band gap control on the photoluminescence behavior of Ba[Zr0.25Ti0.75]O-3 thin films
(Springer, 2009-01-01)
Ba[Zr0.25Ti0.75]O-3 (BZT) thin films were synthesized by the complex polymerization method and heat treated at 400 A degrees C for different times and at 700 A degrees C for 2 h. These thin films were analyzed by X-ray ...
Dielectric properties of soft chemical method derived CaCu3Ti4O12 thin films onto Pt/TiO2/Si(100) substrates
(Elsevier B.V. Sa, 2011-03-03)
Calcium copper titanate, CaCu3Ti4O12 (CCTO), thin film has been deposited by the soft chemical method on Pt/Ti/SiO2/Si (1 0 0) substrates at 700 degrees C for 2 h. The peaks were indexed as cubic phase belonging to the ...
Dielectric properties of soft chemical method derived CaCu3Ti4O12 thin films onto Pt/TiO2/Si(100) substrates
(Elsevier B.V. Sa, 2011-03-03)
Calcium copper titanate, CaCu3Ti4O12 (CCTO), thin film has been deposited by the soft chemical method on Pt/Ti/SiO2/Si (1 0 0) substrates at 700 degrees C for 2 h. The peaks were indexed as cubic phase belonging to the ...
Screen printed PLZT thick films prepared from nanopowders
(Elsevier B.V., 2007-01-01)
The gap between the bulk materials and thin films can be filled with thick films suitably designed and appropriate processed. Thick films of complex system like lead-lanthanum-zirconium titanate (PLZT) is difficult to ...
Dielectric properties of Sr0.75Ba0.25Nb 2O6 thin films: Bias field, frequency and temperature dependence
(Taylor & Francis Ltd, 2002-01-01)
Ferroelectric strontium barium niobate solid solutions had received great attention due to their excellent pyroelectric, electrooptic and photorefractive properties. Furthermore, they usually also present very interesting ...
The self-polarization effect in Pb(Zr0.50Ti0.50)O-3 thin films with no preferential orientation
(Pergamon-Elsevier B.V. Ltd, 2012-11-01)
This work demonstrates the existence of a self-polarization effect in Pb(Zr0.50Ti0.50)O-3 thin films with no preferential orientation. Piezoresponse Force Microscopy (PFM) and dielectric measurements were used to study the ...
Dielectric properties of pure and lanthanum modified bismuth titanate thin films
(Elsevier B.V. Sa, 2014)
Dielectric properties characterization of high dielectric constant thick films
(John Wiley & Sons, 2010-10-01)
A technique for the characterization of microwave dielectric properties of high dielectric constant thick films at room temperature is proposed, using multilayered coplanar waveguide transmission lines with high dielectric ...