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Analog Gross Fault Identification in RF Circuits using Neural Models and Constrained Parameter Extraction

Viveros-Wacher, Andrés; Rayas-Sánchez, José E.; Brito-Brito, Zabdiel (IEEE, 2019-06)

Analog Fault Identification in RF Circuits using Artificial Neural Networks and Constrained Parameter Extraction

Viveros-Wacher, Andrés; Rayas-Sánchez, José E. (IEEE, 2018-08)

Time-frequency analysis combining wavelets and the envelope technique for fault identification in rotary machines

Universidade Estadual Paulista (Unesp); Science and Technology, Campus São José dos Campos - SP, Brazil (2013-03-18)

Nowadays the method based on demodulation by envelope finds wide application in industry as a technique for evaluation of bearings and other components in rotating machinery. In recent years the application of Wavelets for ...

Analog Gross Fault Identification in RF Circuits using Neural Models and Constrained Parameter Extraction

Viveros-Wacher, Andrés; Rayas-Sánchez, José E.; Brito-Brito, Zabdiel (IEEE, 2019)

Analog Fault Identification in RF Circuits using Artificial Neural Networks and Constrained Parameter Extraction

Viveros-Wacher, Andrés; Rayas-Sánchez, José E. (IEEE, 2019)

Analog Gross Fault Identification in RF Circuits using Neural Models and Constrained Parameter Extraction

Viveros-Wacher, Andrés; Rayas-Sánchez, José E.; Brito-Brito, Zabdiel (IEEE, 2019-06)

Analog Fault Identification in RF Circuits using Artificial Neural Networks and Constrained Parameter Extraction

Viveros-Wacher, Andrés; Rayas-Sánchez, José E. (IEEE, 2018-08)

Analog Fault Identification in RF Circuits using Artificial Neural Networks and Constrained Parameter Extraction

Viveros-Wacher, Andrés; Rayas-Sánchez, José E. (IEEE, 2018-08)

Time-frequency analysis combining wavelets and the envelope technique for fault identification in rotary machines

Universidade Estadual Paulista (Unesp); Science and Technology, Campus São José dos Campos - SP, Brazil (2013-03-18)

Time-frequency analysis combining wavelets and the envelope technique for fault identification in rotary machines

de Oliveira, Rafael José Gomes; Gonçalves, Valdeci Donizete; de Medeiros, Everton Coelho; Mathias, Mauro Hugo (2014)

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Analog Gross Fault Identification in RF Circuits using Neural Models and Constrained Parameter Extraction

Analog Fault Identification in RF Circuits using Artificial Neural Networks and Constrained Parameter Extraction

Time-frequency analysis combining wavelets and the envelope technique for fault identification in rotary machines

Analog Gross Fault Identification in RF Circuits using Neural Models and Constrained Parameter Extraction

Analog Fault Identification in RF Circuits using Artificial Neural Networks and Constrained Parameter Extraction

Analog Gross Fault Identification in RF Circuits using Neural Models and Constrained Parameter Extraction

Analog Fault Identification in RF Circuits using Artificial Neural Networks and Constrained Parameter Extraction

Analog Fault Identification in RF Circuits using Artificial Neural Networks and Constrained Parameter Extraction

Time-frequency analysis combining wavelets and the envelope technique for fault identification in rotary machines

Time-frequency analysis combining wavelets and the envelope technique for fault identification in rotary machines