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X-ray Bragg-Surface Diffraction: A Tool to Study In-Plane Strain Anisotropy Due to Ion-Beam-Induced Epitaxial Crystallization in Fe+-Implanted Si(001)
(Amer Chemical SocWashingtonEUA, 2010)
Synchrotron x-ray multiple diffraction in the study of Fe+ ion implantation in Si(001)
(Iop Publishing LtdBristolInglaterra, 2009)