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Theoretical models for surface forces and adhesion and their measurement using atomic force microscopy
(MDPI AGBasel, 2012-10)
The increasing importance of studies on soft matter and their impact on new technologies, including those associated with nanotechnology, has brought intermolecular and surface forces to the forefront of physics and materials ...
Theoretical Models for Surface Forces and Adhesion and Their Measurement Using Atomic Force Microscopy
(Mdpi Ag, 2012-10-01)
The increasing importance of studies on soft matter and their impact on new technologies, including those associated with nanotechnology, has brought intermolecular and surface forces to the forefront of physics and materials ...
Theoretical Models for Surface Forces and Adhesion and Their Measurement Using Atomic Force Microscopy
(Mdpi Ag, 2012-10-01)
The increasing importance of studies on soft matter and their impact on new technologies, including those associated with nanotechnology, has brought intermolecular and surface forces to the forefront of physics and materials ...
Atomic Force Microscopy: A Powerful Tool for Electrical Characterization
(2017-03-23)
The fundamental principle of atomic force microscopy (AFM) is to obtain images of a surface by measuring deflections on a nanoscale probe. In its more than 25-year history, AFM has had its scope rapidly expanded to various ...
Morphological Characterization of Brazilian Organ Clays Using AFM and SEM Studies
(2013-05)
A combination of SEM (Scanning Electron Microscopy) and AFM (Atomic Force Microscopy) techniques was used to characterise the morphology of Brazilian montmorillonites before and after intercalation of some organic compounds. ...
Nonlinear control system applied to atomic force microscope including parametric errors
(2013-06-01)
The performance of the optimal linear feedback control and of the state-dependent Riccati equation control techniques applied to control and to suppress the chaotic motion in the atomic force microscope are analyzed. In ...
Nonlinear control system applied to atomic force microscope including parametric errors
(2013-06-01)
The performance of the optimal linear feedback control and of the state-dependent Riccati equation control techniques applied to control and to suppress the chaotic motion in the atomic force microscope are analyzed. In ...
Comparative AFM and TEM investigation of the morphology of nylon6-rubber blends
(Elsevier Sci LtdOxfordInglaterra, 2004)
Quantitative analysis and classification of AFM images of human hair
(Blackwell Publishing LtdOxfordInglaterra, 2004)