Otro
Thickness-dependent piezoelectric behaviour and dielectric properties of lanthanum modified BiFeO3 thin films
Registro en:
Processing and Application of Ceramics, v. 5, n. 1, p. 31-39, 2011.
1820-6131
ISSN1820-6131-2011-05-01-31-39.pdf
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Autor
Biasotto, Glenda
Moura, Francisco
Foschini, César
Silva, Elson Longo da
Varela, José Arana
Simões, Alexandre Zirpoli
Resumen
Bi0.85La0.15FeO3 (BLFO) thin films were deposited on Pt(111)/Ti/SiO2 /Si substrates by the soft chemical method. Films with thicknesses ranging from 140 to 280 nm were grown on platinum coated silicon substrates at 500°C for 2 hours. The X-ray diffraction analysis of BLFO films evidenced a hexagonal structure over the entire thickness range investigated. The grain size of the film changes as the number of the layers increases, indicating thickness dependence. It is found that the piezoelectric response is strongly influenced by the film thickness. It is shown that the properties of BiFeO3 thin films, such as lattice parameter, dielectric permittivity, piezoeletric coefficient etc., are functions of misfit strains. Fundação de Amparo à Pesquisa do Estado de São Paulo (FAPESP) Conselho Nacional de Desenvolvimento Científico e Tecnológico (CNPq) Coordenação de Aperfeiçoamento de Pessoal de Nível Superior (CAPES)