Thickness dependence of structure and piezoelectric properties at nanoscale of polycrystalline lead zirconate titanate thin films

dc.contributorUniversidade Estadual Paulista (UNESP)
dc.creatorAraújo, E. B.
dc.creatorLima, E. C.
dc.creatorBdikin, I. K.
dc.creatorKholkin, A. L.
dc.date2014-05-27T11:29:29Z
dc.date2016-10-25T18:48:29Z
dc.date2014-05-27T11:29:29Z
dc.date2016-10-25T18:48:29Z
dc.date2013-05-14
dc.date.accessioned2017-04-06T02:23:52Z
dc.date.available2017-04-06T02:23:52Z
dc.identifierJournal of Applied Physics, v. 113, n. 18, 2013.
dc.identifier0021-8979
dc.identifierhttp://hdl.handle.net/11449/75397
dc.identifierhttp://acervodigital.unesp.br/handle/11449/75397
dc.identifier10.1063/1.4801961
dc.identifierWOS:000319294100112
dc.identifier2-s2.0-84878074968.pdf
dc.identifier2-s2.0-84878074968
dc.identifierhttp://dx.doi.org/10.1063/1.4801961
dc.identifier.urihttp://repositorioslatinoamericanos.uchile.cl/handle/2250/896141
dc.descriptionLead zirconate titanate Pb(Zr0.50Ti0.50)O3 (PZT) thin films were deposited by a polymeric chemical method on Pt(111)/Ti/SiO2/Si substrates to understand the mechanisms of phase transformations and the effect of film thickness on the structure, dielectric, and piezoelectric properties in these films. PZT films pyrolyzed at temperatures higher than 350 °C present a coexistence of pyrochlore and perovskite phases, while only perovskite phase grows in films pyrolyzed at temperatures lower than 300 °C. For pyrochlore-free PZT thin films, a small (100)-orientation tendency near the film-substrate interface was observed. Finally, we demonstrate the existence of a self-polarization effect in the studied PZT thin films. The increase of self-polarization with the film thickness increasing from 200 nm to 710 nm suggests that Schottky barriers and/or mechanical coupling near the film-substrate interface are not primarily responsible for the observed self-polarization effect in our films. © 2013 AIP Publishing LLC.
dc.languageeng
dc.relationJournal of Applied Physics
dc.rightsinfo:eu-repo/semantics/closedAccess
dc.subjectFilm-substrate interfaces
dc.subjectLead zirconate titanate
dc.subjectLead zirconate titanate thin films
dc.subjectMechanical coupling
dc.subjectPerovskite phasis
dc.subjectPiezoelectric property
dc.subjectSelf polarization
dc.subjectThickness dependence
dc.subjectFilm thickness
dc.subjectLead
dc.subjectPiezoelectricity
dc.subjectPolarization
dc.subjectPolymeric films
dc.subjectSchottky barrier diodes
dc.subjectSemiconducting lead compounds
dc.subjectSubstrates
dc.subjectThin films
dc.subjectTitanium
dc.subjectZirconium
dc.subjectInterfaces (materials)
dc.titleThickness dependence of structure and piezoelectric properties at nanoscale of polycrystalline lead zirconate titanate thin films
dc.typeOtro


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