Now showing items 21-30 of 4714
Role of residual stress on phase transformations of Pb(Zr0.50Ti0.50)O3 thin films obtained from chemical route
abstract: The effects of heat treatment on the phase transformations of lead zirconate titanate Pb(Zr0.50Ti0.50)O3 (PZT) thin films were studied. The pyrolysis temperature directly affected the densification, residual ...
Structural, dielectric, ferroelectric and optical properties of PBCT, PBST and PCST complex thin films on LaNiO3 metallic conductive oxide layer coated Si substrates by the CSD technique
(Elsevier B.V., 2014-10-05)
Ferroelectric thin films and LaNiO3 (LNO) metallic conductive oxide thin films were prepared by a chemical solution deposition (CSD) method. PBCT60, PBST60 and PCST60 ferroelectric thin films were grown on different ...
Influence of temperature on the microstructure and electrical properties of BBT thin films
(Taylor & Francis Ltd, 2003-01-01)
The BBT films were prepared by a spin-coating process from the polymeric precursor method (Pechini process). In order to study the influence of the temperature on the BBT microstructure and electrical properties, the films ...
Microstructural and ferroelectric properties of PbZr1-xTi(x)O(3) thin films prepared by the polymeric precursor method
(Elsevier B.V., 2001-07-01)
The polymeric precursor method was employed in the preparation of PZT thin films on Pt(111)Ti/SiO2/Si(100) substrates. X-ray diffraction patterns revealed the polycrystalline nature of the PZT (53:47) thin films, which had ...
Improved photoluminescence emission and gas sensor properties of ZnO thin films
In this article, we report a comparative study of the influence of pressure-assisted (1.72 MPa) versus ambient pressure thermal annealing on both ZnO thin films treated at 330 °C for 32 h. The effects of pressure on the ...
Plasma enhanced chemical vapor deposition of titanium(IV) ethoxide-oxygen-helium mixtures
(Elsevier Science SaLausanneSuíça, 2008)
Crystallization and optical properties of CCTO thin films under pressure influence
CCTO thin films were deposited on Pt(111)/Ti/SiO 2/Si substrates using a chemical (polymeric precursor) and pressure method. The pressure effects on the CCTO thin films were evaluated by XRD, FEG-SEM and optical properties. ...