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Análise e comparação entre algoritmos de percolação
(Universidade Federal do Rio Grande do NorteBRUFRNPrograma de Pós-Graduação em Matemática Aplicada e EstatísticaProbabilidade e Estatística; Modelagem Matemática, 2008-07-25)
In this work, we study and compare two percolation algorithms, one of then elaborated by Elias, and the other one by Newman and Ziff, using theorical tools of algorithms complexity and another algorithm that makes an ...
Agrupamento de sequências de miRNA utilizando aprendizado não-supervisionado baseado em grafos
(Universidade Federal de São CarlosUFSCarPrograma de Pós-graduação em Ciência da ComputaçãoCâmpus São Carlos, 2016-08-12)
Cluster analysis is the organization of a collection of patterns into clusters based on similarity
which is determined by using properties of data. Clustering techniques can be useful in a
variety of knowledge domains ...
String-averaging expectation-maximization for maximum likelihood estimation in emission tomography
(IOP PublishingBristol, 2014-04-17)
We study the maximum likelihood model in emission tomography and propose a new family of algorithms for its solution, called string-averaging expectation-maximization (SAEM). In the string-averaging algorithmic regime, the ...
String-averaging expectation-maximization for maximum likelihood estimation in emission tomography
(Iop Publishing Ltd, 2014-05-01)
We study the maximum likelihood model in emission tomography and propose a new family of algorithms for its solution, called string-averaging expectation maximization (SAEM). In the string-averaging algorithmic regime, the ...
String-averaging expectation-maximization for maximum likelihood estimation in emission tomography
(Iop Publishing Ltd, 2014)
ON THE RELATION BETWEEN THE ISRA AND THE EM ALGORITHM FOR POSITRON EMISSION TOMOGRAPHY
(Ieee-inst Electrical Electronics Engineers IncNew York, 1993)
MULTIPLICATIVE ITERATIVE METHODS IN COMPUTED-TOMOGRAPHY
(Springer VerlagNew York, 1991)
Fast EM-like methods for maximum "a posteriori" estimates in emission tomography
(Ieee-inst Electrical Electronics Engineers IncNew YorkEUA, 2001)